NS-30NIR Desktop Automatic Film Thickness Tester
The NS-30 Series is a desktop automated film thickness measurement and analysis system. Integrating an automated sample stage with film thickness measurement, it automatically measures pre-set locations and generates 2D and 3D data distribution maps. The NS-30 Series is suitable for wafer and photovoltaic cell film thickness measurements.
Features：
● Automatic sample measurement with selectable platform sizes from 100mm to 450mm
● Software automatically generates measurement point distribution based on your needs
● 2D and 3D mapping, including thickness, refractive index, and reflectivity information
● Measurement of film stress and surface bow
|
Model |
NS-30NIR |
|
Wavelength Range |
950 nm – 1700 nm |
|
Thickness Measurement Range |
150 nm – 250 μm |
|
Accuracy |
3 nm or 0.4% |
|
Precision |
0.1 nm |
|
Stability |
0.12 nm |
|
Spot Size |
1.5 mm |
|
Measurement Speed |
< 1 second (single measurement) |
|
Light Source |
Halogen Tungsten Lamp |
|
Sample Size |
Diameters from 1 mm to 300 mm or larger |
