NS-20NIR Desktop Manual Film Thickness Tester
The NS-20 series is a desktop manual film thickness measurement and analysis system. While maintaining a compact and lightweight design, it maintains uncompromising accuracy and stability. It incorporates all the algorithmic software features of the NanoSense series, offering exceptional value for money.
Features：
● Manual measurement with ultimate flexibility
● Standard version with a spot size of 0.8 to 1.5 mm
● Upgradeable to a micro spot size of 0.2 mm (NS-20 Pro)
● Customizable carrying case for on-the-go film thickness analysis
● Optional large sample stage
|
Model |
NS-20NIR |
|
Wavelength Range |
950 nm – 1700 nm |
|
Thickness Measurement Range |
150 nm – 250 μm |
|
Accuracy |
3 nm或0.4% |
|
Precision |
0.1 nm |
|
Stability |
0.12 nm |
|
Spot Size |
1.5 mm |
|
Measurement Speed |
< 1 second (single measurement) |
|
Light Source |
Halogen Tungsten Lamp |
|
Sample Size |
Diameters from 1 mm to 300 mm or larger |
